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	1.	Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies by Bosio, Alberto Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud V Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Springer, ©2010 Availability: Items available for reference: IIITD: Not for loan (1)Call number: REF 621.397 BOS-A. Add to cart (remove)
	2.	Nanometer variation-tolerant SRAM : circuits and statistical design for yield by Abu-Rahma, Mohamed H Anis, Mohab Material type: Text; Format: print ; Literary form: Not fiction Publication details: New York : Springer, ©2013 Availability: Items available for reference: IIITD: Not for loan (1)Call number: REF 621.397 ABU-N. Add to cart (remove)

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