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Nanometer variation-tolerant SRAM : circuits and statistical design for yield

By: Abu-Rahma, Mohamed H.
Contributor(s): Anis, Mohab.
Material type: materialTypeLabelBookPublisher: New York : Springer, ©2013Description: xvi, 170 p. : ills. ; 24cm.ISBN: 9781493902200.Subject(s): Engineering | Systems engineering | Computer-aided design | Random access memory
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Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books IIITD
Electronics and Communication Engineering REF 621.397 ABU-N (Browse shelf) Not For Loan 009736
Total holds: 0

Includes bibliography and index

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