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Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies

By: Bosio, Alberto.
Contributor(s): Luigi Dilillo | Patrick Girard | Serge Pravossoudovitch | Arnaud V.
Material type: materialTypeLabelBookPublisher: New York : Springer, ©2010Description: xv, 171 p. : ills. ; 23cm.ISBN: 9781489983145.Subject(s): Engineering | Random access memory-testing | Systems engineering | Computer-aided design
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Electronics and Communication Engineering REF 621.397 BOS-A (Browse shelf) Checked out Not For Loan 18/12/2019 009733
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