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VLSI test principles and architectures : design for testability
By: Wang, Laung-Terng (ed.).
Contributor(s): Wu, Cheng-Wen (ed.) | Wen, Xiaoqing (ed.).
Material type:
BookSeries: The Morgan Kaufmann series in systems on silicon. Publisher: New Delhi : Elsevier, ©2006Description: xxx, 777 p. : ill. ; 25 cm.ISBN: 9789380501550.Subject(s): Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- DesignOnline resources: Table of contents | Publisher description
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD Reference | Electronics and Communication Engineering | REF 621.395 WAN-V (Browse shelf) | Not For Loan | 008153 | ||
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IIITD General Stacks | Electronics and Communication Engineering | 621.395 WAN-V (Browse shelf) | Available | 002299 |
Total holds: 0
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| REF 621.395 RAB-D Digital integrated circuits : | REF 621.395 TAU-F Fundamentals of modern VLSI devices | REF 621.395 WAK-D Digital design : | REF 621.395 WAN-V VLSI test principles and architectures : | REF 621.395 WES-C CMOS VLSI design : | REF 621.395 WES-C CMOS VLSI design : | REF 621.397 ABU-N Nanometer variation-tolerant SRAM : |
Includes bibliographical references and index.
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