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VLSI test principles and architectures : design for testability
Material type:
TextSeries: The Morgan Kaufmann series in systems on siliconPublication details: New Delhi : Elsevier, ©2006.Description: xxx, 777 p. : ill. ; 25 cmISBN: - 9789380501550
- 621.395 22 WAN-V
- TK7874.75 .V587 2006
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD Reference | Electronics and Communication Engineering | REF 621.395 WAN-V (Browse shelf(Opens below)) | Available | 008153 | ||
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IIITD General Stacks | Electronics and Communication Engineering | 621.395 WAN-V (Browse shelf(Opens below)) | Available | 002299 |
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| REF 621.395 SAU-I Introduction to VLSI design flow | REF 621.395 TAU-F Fundamentals of modern VLSI devices | REF 621.395 WAK-D Digital design : principles and practices | REF 621.395 WAN-V VLSI test principles and architectures : design for testability | REF 621.395 WES-C CMOS VLSI design : a circuits and systems perspective | REF 621.395 WES-C CMOS VLSI design : a circuits and systems perspective | REF 621.397 ABU-N Nanometer variation-tolerant SRAM : |
Includes bibliographical references and index.
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