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Wang, Laung-Terng (ed.)

VLSI test principles and architectures : design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. - New Delhi : Elsevier, ©2006. - xxx, 777 p. : ill. ; 25 cm. - The Morgan Kaufmann series in systems on silicon .

Includes bibliographical references and index.

9789380501550

2006006869


Integrated circuits--Very large scale integration--Testing.
Integrated circuits--Very large scale integration--Design.

TK7874.75 / .V587 2006

621.395 / WAN-V

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