MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01439cam a22003494a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
14278872 |
| 003 - CONTROL NUMBER IDENTIFIER |
|---|
| control field |
IIITD |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20210206152116.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
060227s2006 ne a b 001 0 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
2006006869 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
9789380501550 |
| 035 ## - SYSTEM CONTROL NUMBER |
|---|
| System control number |
(OCoLC)ocm64624834 |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
DLC |
| Transcribing agency |
DLC |
| Modifying agency |
BAKER |
| -- |
C#P |
| -- |
IXA |
| -- |
DLC |
| 042 ## - AUTHENTICATION CODE |
|---|
| Authentication code |
pcc |
| 050 00 - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK7874.75 |
| Item number |
.V587 2006 |
| 082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
621.395 |
| Edition number |
22 |
| Item number |
WAN-V |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
VLSI test principles and architectures : |
| Remainder of title |
design for testability |
| Statement of responsibility, etc |
edited by Laung-Terng Wang, Cheng-Wen Wu and Xiaoqing Wen. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) |
|---|
| Place of publication, distribution, etc |
New Delhi : |
| Name of publisher, distributor, etc |
Elsevier, |
| Date of publication, distribution, etc |
©2006. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xxx, 777 p. : |
| Other physical details |
ill. ; |
| Dimensions |
25 cm. |
| 440 #4 - SERIES STATEMENT/ADDED ENTRY--TITLE |
|---|
| Title |
The Morgan Kaufmann series in systems on silicon |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc |
Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Testing. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name as entry element |
Integrated circuits |
| General subdivision |
Very large scale integration |
| -- |
Design. |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wang, Laung-Terng |
| Relator term |
editor |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wu, Cheng-Wen |
| Relator term |
editor |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Wen, Xiaoqing |
| Relator term |
editor |
| 856 41 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Table of contents |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/toc/ecip069/2006006869.html">http://www.loc.gov/catdir/toc/ecip069/2006006869.html</a> |
| 856 42 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Materials specified |
Publisher description |
| Uniform Resource Identifier |
<a href="http://www.loc.gov/catdir/enhancements/fy0632/2006006869-d.html">http://www.loc.gov/catdir/enhancements/fy0632/2006006869-d.html</a> |
| 906 ## - LOCAL DATA ELEMENT F, LDF (RLIN) |
|---|
| a |
7 |
| b |
cbc |
| c |
orignew |
| d |
1 |
| e |
ecip |
| f |
20 |
| g |
y-gencatlg |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Dewey Decimal Classification |
| Koha item type |
Books |
| Koha issues (borrowed), all copies |
3 |
