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1.
Analog IC reliability in nanometer CMOS by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Springer, ©2013
Availability: Not available: IIITD: Loan on demand (1).

2.
Symbolic analysis for automated design of analog integrated circuits by Series: Kluwer international series in engineering and computer science ; SECS 137. | Kluwer international series in engineering and computer science. VLSI, computer architecture, and digital signal processing.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Boston : Kluwer Academic Publishers, ©1991
Availability: Items available for loan: IIITD (1)Call number: 621.3815 GIE-S.

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