Thoughtful machine learning: a test-driven approach
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 9789351108573
- 006.31 KIR-T
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD General Stacks | Computer Science and Engineering | 006.31 KIR-T (Browse shelf(Opens below)) | Available | 004777 | ||
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IIITD Reference | Computer Science and Engineering | REF 006.31 KIR-T (Browse shelf(Opens below)) | Checked out | 03/07/2024 | 004778 |
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006.31 KEL-D Deep learning | 006.31 KEL-D Deep learning | 006.31 KEL-M Machine learning in production : | 006.31 KIR-T Thoughtful machine learning: a test-driven approach | 006.31 LAK-M Machine learning design patterns : solutions to common challenges in data preparation, model building, and MLOps | 006.31 MIC-M Machine learning, neural and statistical classification | 006.31 MIT-M Machine learning |
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