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Thoughtful machine learning: a test-driven approach

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BookPublisher: New Delhi: O'Reilly, ©2015Description: xiv, 217 p.; 22 cm.ISBN: 9789351108573.Subject(s): Machine learning | Computer software--Development | Computer software--TestingOnline resources: Click here to access online

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Item type	Current location	Collection	Call number	Status	Date due	Barcode	Item holds
Books	IIITD General Stacks	Computer Science and Engineering	006.31 KIR-T (Browse shelf)	Checked out	19/02/2020	004777
Books	IIITD Reference	Computer Science and Engineering	REF 006.31 KIR-T (Browse shelf)	Not For Loan		004778

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