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Thoughtful Machine Learning: a test-driven approach

By: Kirk, Matthew.
Material type: materialTypeLabelBookPublisher: New Delhi: O'Reilly, ©2015Description: xiv, 217 p.ISBN: 9789351108573.Subject(s): Machine learning | Computer software--Development | Computer software--TestingOnline resources: Click here to access online
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Item type Current location Collection Call number Status Date due Barcode Item holds
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Computer Science and Engineering 006.31 KIR-T (Browse shelf) Available 004777
Books Books IIITD
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Computer Science and Engineering REF 006.31 KIR-T (Browse shelf) Not For Loan 004778
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