Thoughtful machine learning: a test-driven approach
By: Kirk, Matthew.
Material type:
Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
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IIITD General Stacks | Computer Science and Engineering | 006.31 KIR-T (Browse shelf) | Checked out | 11/12/2019 | 004777 | |
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IIITD Reference | Computer Science and Engineering | REF 006.31 KIR-T (Browse shelf) | Not For Loan | 004778 |
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