000 01445cam a2200361 a 4500
001 14434121
005 20140426153716.0
008 060630s2007 flua b 001 0 eng
010 _a 2006021811
015 _aGBA672340
_2bnb
016 7 _a013537248
_2Uk
020 _a9780849330575
035 _a(OCoLC)ocm70258946
035 _a(OCoLC)70258946
040 _aDLC
_cDLC
_dYDX
_dBAKER
_dBTCTA
_dUKM
_dYDXCP
_dDLC
050 0 0 _aTK7874
_b.P445 2007
082 0 0 _a621.381
_222
_bPER-D
100 1 _aPerelroyzen, Evgeni.
245 1 0 _aDigital integrated circuits :
_bdesign-for-test using simulink and stateflow
_cEvgeni Perelroyzen.
246 3 0 _aDesign-for-test using Simulink and Stateflow
260 _aBoca Raton, FL :
_bCRC Press,
_cc2007.
300 _a320 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
630 0 0 _aSIMULINK.
630 0 0 _aMATLAB.
650 0 _aDigital integrated circuits
_xTesting.
650 0 _aDigital integrated circuits
_xDesign and construction.
856 4 1 _3Table of contents only
_uhttp://www.loc.gov/catdir/toc/ecip0616/2006021811.html
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0661/2006021811-d.html
906 _a7
_bcbc
_corignew
_d1
_eecip
_f20
_gy-gencatlg
942 _2ddc
_cBK
999 _c9953
_d9953