000			00833nam a22002417a 4500
003			IIITD
005			20220206020003.0
008			190814b xxu||||| |||| 00| 0 eng d
020			_a9788132202325
040			_aDLC
082	0	4	_a621.381 _bPAV-C
100	1		_aPavlov, Andrei
245	1	0	_aCMOS SRAM circuit design and parametric test in nano-scaled technologies : _bprocess-aware SRAM design and test _cAndrei Pavlov, Manoj Sachdev.
260			_aNew Delhi : _bSpringer, _c©2008.
300			_axvi, 193 p. : _bill. ; _c25 cm.
490			_aFrontiers in electronic testing ; _v40
504			_aIncludes bibliographical references and index.
650		0	_aMetal oxide semiconductors, Complementary _xDesign.
650		0	_aRandom access memory.
650		0	_aNanoelectronics.
700	1		_aSachdev, Manoj
942			_2ddc _cBK _03
999			_c14204 _d14204