Design for manufacturability and yield for nano-scale CMOS
Material type: TextSeries: Series on integrated circuits and systemsPublication details: New Delhi : Springer, c2007.Description: xxvii, 254 p. : ill. ; 24 cmISBN:- 9788184892424
- 620.004 CHI-D
- TK7867 .C54 2007
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Electronics and Communication Engineering | 620.004 CHI-D (Browse shelf(Opens below)) | Available | 002406 |
Total holds: 0
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620.004 BAL-R Reliability engineering | 620.004 BIL-R Reliability evaluation of engineering systems : | 620.004 BIR-R Reliability engineering : | 620.004 CHI-D Design for manufacturability and yield for nano-scale CMOS | 620.004 SLA-M Microprocessor-based design : | 620.0042 HAI-E Engineering design process | 620.007 EAR-O Outcome-based curriculum in engineering education |
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