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NASA Formal Methods [electronic resource] : 7th International Symposium, NFM 2015, Pasadena, CA, USA, April 27-29, 2015, Proceedings /

Contributor(s): Material type: TextTextSeries: Programming and Software Engineering ; 9058Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Edition: 1st ed. 2015Description: XIII, 458 p. 115 illus. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9783319175249
Subject(s): Additional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification:
  • 005.1 23
LOC classification:
  • QA76.758
Online resources: In: Springer Nature eBookSummary: This book constitutes the refereed proceedings of the 7th International Symposium on NASA Formal Methods, NFM 2015, held in Pasadena, CA, USA, in April 2015. The 24 revised regular papers presented together with 9 short papers were carefully reviewed and selected from 108 submissions. The topics include model checking, theorem proving; SAT and SMT solving; symbolic execution; static analysis; runtime verification; systematic testing; program refinement; compositional verification; security and intrusion detection; modeling and specification formalisms; model-based development; model-based testing; requirement engineering; formal approaches to fault tolerance; and applications of formal methods.
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This book constitutes the refereed proceedings of the 7th International Symposium on NASA Formal Methods, NFM 2015, held in Pasadena, CA, USA, in April 2015. The 24 revised regular papers presented together with 9 short papers were carefully reviewed and selected from 108 submissions. The topics include model checking, theorem proving; SAT and SMT solving; symbolic execution; static analysis; runtime verification; systematic testing; program refinement; compositional verification; security and intrusion detection; modeling and specification formalisms; model-based development; model-based testing; requirement engineering; formal approaches to fault tolerance; and applications of formal methods.

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