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| 001 | 15202514 | ||
| 005 | 20200221020003.0 | ||
| 008 | 080303s2008 ne a b 001 0 eng | ||
| 010 | _a 2008924192 | ||
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_a014567544 _2Uk |
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_aTK7871.99.M44 _bP38 2008 |
| 082 | 0 | 4 |
_a621.381 _222 _bPAV-C |
| 100 | 1 |
_aPavlov, Andrei, _cPh. D. |
|
| 245 | 1 | 0 |
_aCMOS SRAM circuit design and parametric test in nano-scaled technologies : _bprocess-aware SRAM design and test _cAndrei Pavlov, Manoj Sachdev. |
| 260 |
_aNew Delhi : _bSpringer, _cc2008. |
||
| 300 |
_axvi, 193 p. : _bill. ; _c25 cm. |
||
| 440 | 0 |
_aFrontiers in electronic testing ; _v40 |
|
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xDesign. |
|
| 650 | 0 | _aRandom access memory. | |
| 650 | 0 | _aNanoelectronics. | |
| 700 | 1 | _aSachdev, Manoj. | |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/toc/fy1001/2008924192.html |
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_a7 _bcbc _ccopycat _d2 _encip _f20 _gy-gencatlg |
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