| 000 | 01128cam a22003255a 4500 | ||
|---|---|---|---|
| 001 | 17543404 | ||
| 003 | IIITD | ||
| 005 | 20170603143631.0 | ||
| 008 | 121129s2012 nyu 000 0 eng | ||
| 010 | _a 2012954854 | ||
| 020 | _a9781461461623 | ||
| 040 |
_aDLC _cDLC _dDLC |
||
| 042 | _apcc | ||
| 082 |
_a621.381 _bMAR-A |
||
| 100 | _aMaricau, Elie | ||
| 245 | 0 | 0 |
_aAnalog IC reliability in nanometer CMOS _cElie Maricau & Georges gielen |
| 260 |
_aNew York : _bSpringer, _c©2013. |
||
| 263 | _a1211 | ||
| 300 |
_axvi,198 p.; _c22 cm. |
||
| 600 | _aAnalog circuits | ||
| 600 | _aLinear integrated circuits--Reliability | ||
| 600 | _aSystems engineering | ||
| 610 | _aMetal oxide semiconductors, Complementary | ||
| 700 | _aGeorges Gielen | ||
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy1317/2012954854-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy1317/2012954854-t.html |
| 906 |
_a0 _bibc _corignew _d2 _eepcn _f20 _gy-gencatlg |
||
| 942 |
_2ddc _cBK |
||
| 999 |
_c10918 _d10918 |
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