| 000 | 00940cam a22002893u 4500 | ||
|---|---|---|---|
| 001 | 11129419 | ||
| 005 | 20240604020003.0 | ||
| 006 | m d | ||
| 007 | cr n | ||
| 008 | 141218s2014 ||||||||s|||||||| ||||| d | ||
| 020 | _a9789351108573 | ||
| 035 | _a(WaSeSS)ssib019812282 | ||
| 040 |
_aWaSeSS _cWaSeSS _dWaSeSS _erda |
||
| 082 |
_a006.31 _bKIR-T |
||
| 100 | 1 | _aKirk, Matthew | |
| 245 | 1 | 0 |
_aThoughtful machine learning: _cMatthew Kirk. _ba test-driven approach |
| 260 |
_aNew Delhi: _bO'Reilly, _c©2015. |
||
| 300 |
_axiv, 217 p.; _c22 cm. |
||
| 500 | _aTitle from content provider. | ||
| 506 | _aLicense restrictions may limit access. | ||
| 650 | _aMachine learning | ||
| 658 | _aComputer software--Development | ||
| 658 | _aComputer software--Testing | ||
| 856 | 4 | 0 | _uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio11129419 |
| 910 | _aSerials Solutions supplemental brief record | ||
| 942 |
_2ddc _cBK _015 |
||
| 999 |
_c10424 _d10424 |
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