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1.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Series: Frontiers in electronic testing ; 40
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi : Springer, c2008
Online access:
Availability: Items available for loan: IIITD (1)Call number: 621.381 PAV-C.

2.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Series: Frontiers in electronic testing ; 40
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi : Springer, ©2008
Availability: Items available for reference: IIITD: Not for loan (1)Call number: 621.3815 PAV-C.

3.
Robust SRAM designs and analysis by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Springer, ©2013
Availability: Items available for loan: IIITD (1)Call number: 621.397 JAW-R.

4.
Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Springer, ©2010
Availability: Items available for reference: IIITD: Not for loan (1)Call number: REF 621.397 BOS-A.

5.
Low power and reliable SRAM memory cell and array design by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Springer, ©2011
Availability: Items available for reference: IIITD: Not for loan (1)Call number: REF 621.395 ISH-L.

6.
Nanometer variation-tolerant SRAM : circuits and statistical design for yield by
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Springer, ©2013
Availability: Items available for reference: IIITD: Not for loan (1)Call number: REF 621.397 ABU-N.

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