Structural, Syntactic, and Statistical Pattern Recognition [electronic resource] : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings /
Material type: TextSeries: Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 4109Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006Edition: 1st ed. 2006Description: XXI, 939 p. online resourceContent type:- text
- computer
- online resource
- 9783540372417
- 006.4 23
- Q337.5
- TK7882.P3
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Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.
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Invited Talks -- SSPR -- Poster Papers -- SPR -- Poster Papers.
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