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	1.	CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Pavlov, Andrei, Ph. D Sachdev, Manoj Series: Frontiers in electronic testing ; 40 Material type: Text; Format: print ; Literary form: Not fiction Publication details: New Delhi : Springer, c2008 Online access: Table of contents only Availability: Items available for loan: IIITD (1)Call number: 621.381 PAV-C. Place hold Add to cart (remove)
	2.	Defect-oriented testing for nano-metric CMOS VLSI circuits by Sachdev, Manoj . Defect oriented testing for CMOS analog and digital circuits Pineda de Gyvez, Jose Series: Frontiers in electronic testing ; 34. Edition: 2nd ed. Material type: Text; Format: print ; Literary form: Not fiction Publication details: Dordrecht : Springer, c2007 Availability: Items available for loan: IIITD (1)Call number: 621.395 SAC-D. Place hold Add to cart (remove)
	3.	CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Pavlov, Andrei Sachdev, Manoj Series: Frontiers in electronic testing ; 40 Material type: Text; Format: print ; Literary form: Not fiction Publication details: New Delhi : Springer, ©2008 Availability: Items available for reference: IIITD: Not for loan (1)Call number: 621.3815 PAV-C. Add to cart (remove)

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