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1.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Series: Frontiers in electronic testing ; 40
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi : Springer, c2008
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Availability: Items available for loan: IIITD (1)Call number: 621.381 PAV-C.

2.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Series: Frontiers in electronic testing ; 40
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi : Springer, ©2008
Availability: Items available for reference: IIITD: Not for loan (1)Call number: 621.3815 PAV-C.

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