Fault diagnosis of analog integrated circuits

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Material type: Text

TextSeries: Frontiers in electronic testing ; v. 30Publication details: New Delhi : Springer, c2005.Description: ix, 182pISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Books	IIITD General Stacks	Electronics and Communication Engineering	621.3815 KAB-F (Browse shelf(Opens below))	Available		002391

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Includes bibliographical references and index.

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