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1.
Soft errors in modern electronic systems by Series: Frontiers in electronic testing ; 41.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New York : Springer, c2011
Availability: Items available for loan: IIITD (1)Call number: REF 621.395 NIC-S.

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2.
Fault diagnosis of analog integrated circuits by Series: Frontiers in electronic testing ; v. 30
Material type: Text Text; Format: electronic available online remote; Literary form: Not fiction
Publication details: New Delhi : Springer, c2005
SpringerLink ebooks - Engineering (2005)
Availability: Items available for loan: IIITD (1)Call number: 621.3815 KAB-F.

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3.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Series: Frontiers in electronic testing ; 40
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi : Springer, c2008
Online access:
Availability: Items available for loan: IIITD (1)Call number: 621.381 PAV-C.

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4.
Defect-oriented testing for nano-metric CMOS VLSI circuits by Series: Frontiers in electronic testing ; 34.
Edition: 2nd ed.
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: Dordrecht : Springer, c2007
Availability: Items available for loan: IIITD (1)Call number: 621.395 SAC-D.

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5.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Series: Frontiers in electronic testing ; 40
Material type: Text Text; Format: print ; Literary form: Not fiction
Publication details: New Delhi : Springer, ©2008
Availability: Items available for reference: IIITD: Not for loan (1)Call number: 621.3815 PAV-C.

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