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1. Markov random field modeling in image analysis

by Li, Stan Z.

Edition: 3rd ed.Material type: book Book; Format: print ; Literary form: not fiction Publisher: Springer, 2009Availability:
Items available for reference: IIITD [REF 621.367 LI-M] (1).

2. Encyclopedia of Biometrics [electronic resource] /

by Li, Stan Z [editor.] | Jain, Anil K [editor.] | SpringerLink (Online service).

Source: Springer Nature Living ReferenceMaterial type: book Book; Format: electronic available online remote; Literary form: not fiction Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2019Online access: Click here to access online Availability: No items available


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