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	1.	Genetic algorithms for VLSI design, layout and test automation by Mazumder, Pinaki Rudnick, Elizabeth M Material type: Text; Format: print ; Literary form: Not fiction Publication details: Pearson, 2004 Availability: Items available for loan: IIITD (1)Call number: REF 621.395 MAZ-G. Place hold Add to cart (remove)
	2.	Fault-tolerance and reliability techniques for high-density random-access memories by Chakraborty, Kanad Mazumder, Pinaki Material type: Text; Format: print ; Literary form: Not fiction Publication details: Delhi : Pearson Education, ©2002 Availability: Items available for loan: IIITD (1)Call number: 621.3973 CHA-F. Place hold Add to cart (remove)

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