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Fault-tolerance and reliability techniques for high-density random-access memories

By: Contributor(s): Material type: TextTextPublication details: Delhi : Pearson Education, ©2002.Description: xix, 426 p.; 25 cmISBN:
  • 9788178087696
DDC classification:
  • 621.3973 CHA-F
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Holdings
Item type Current library Collection Call number Status Notes Date due Barcode Item holds
Books Books IIITD General Stacks Electronics and Communication Engineering 621.3973 CHA-F (Browse shelf(Opens below)) Available Gifted by Dr. G.S. Visweswaran G01166
Total holds: 0

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