Defect-oriented testing for nano-metric CMOS VLSI circuits

By:

Contributor(s):

Material type: Text

TextSeries: Frontiers in electronic testing ; 34.Publication details: Dordrecht : Springer, c2007.Edition: 2nd edDescription: xxi, 328 p. : ill. ; 24 cmISBN:

Subject(s):

DDC classification:

LOC classification:

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Books	IIITD General Stacks	Electronics and Communication Engineering	621.395 SAC-D (Browse shelf(Opens below))	Available		002602

Total holds: 0

New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.

There are no comments on this title.

to post a comment.