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1. Genetic algorithms for VLSI design, layout and test automation

by Mazumder, Pinaki | Rudnick, Elizabeth M.

Material type: book Book; Format: print ; Literary form: not fiction Publisher: Pearson, 2004Availability:
Items available for reference: IIITD [REF 621.395 MAZ-G] (1).

2. Fault-tolerance and reliability techniques for high-density random-access memories

by Chakraborty, Kanad | Mazumder, Pinaki.

Material type: book Book; Format: print ; Literary form: not fiction Publisher: Delhi : Pearson Education, ©2002Availability: Items available for loan: IIITD [621.3973 CHA-F] (1).


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