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VLSI Design and Test [electronic resource] : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers /

Contributor(s): Material type: TextTextSeries: Communications in Computer and Information Science ; 892Publisher: Singapore : Springer Nature Singapore : Imprint: Springer, 2019Edition: 1st ed. 2019Description: XVIII, 722 p. 711 illus., 324 illus. in color. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9789811359507
Subject(s): Additional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification:
  • 004 23
LOC classification:
  • TK7885-7895
Online resources:
Contents:
Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.
In: Springer Nature eBookSummary: This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
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Digital design -- Analog and mixed signal design -- Hardware security -- Micro bio-fluidics -- VLSI testing -- Analog circuits and devices -- Network-on-chip -- Memory -- Quantum computing and NoC -- Sensors and interfaces.

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

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