FEEDBACK Smiley face

Your search returned 4 results. Subscribe to this search

|
1. CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

by Pavlov, Andrei | Sachdev, Manoj.

Material type: book Book; Format: print ; Literary form: not fiction Publisher: New Delhi : Springer, ©2008Availability: Items available for loan: IIITD [621.3815 PAV-C] (1).

2. Defect-oriented testing for nano-metric CMOS VLSI circuits

by Sachdev, Manoj | Defect oriented testing for CMOS analog and digital circuits | Pineda de Gyvez, Jose.

Edition: 2nd ed.Material type: book Book; Format: print ; Literary form: not fiction Publisher: Dordrecht : Springer, c2007Availability: Items available for loan: IIITD [621.395 SAC-D] (1).

3. Fault diagnosis of analog integrated circuits

by Kabisatpathy, Prithviraj | Barua, Alok | Sinha, Satyabroto.

Source: SpringerLink ebooks - Engineering (2005)Material type: book Book; Format: electronic available online remote; Literary form: not fiction Publisher: New Delhi : Springer, c2005Availability: Items available for loan: IIITD [621.3815 KAB-F] (1).

4. CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

by Pavlov, Andrei, Ph. D | Sachdev, Manoj.

Material type: book Book; Format: print ; Literary form: not fiction Publisher: New Delhi : Springer, c2008Online access: Table of contents only Availability: Items available for loan: IIITD [621.381 PAV-C] (1).


© IIIT-Delhi, 2013 | Phone: +91-11-26907510| FAX +91-11-26907405 | E-mail: library@iiitd.ac.in