Next generation wireless LANs : throughput, robustness, and reliability in 802.11n

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TextPublication details: New Delhi : Cambridge University Press, 2008.Description: xxx, 385 p. : ill. ; 26 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode	Item holds
Books	IIITD General Stacks	Electronics and Communication Engineering	621.398 PER-N (Browse shelf(Opens below))	Available		002641

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Previous	621.397 UYE-C CMOS logic circuit design	621.397 UYE-C CMOS logic circuit design	621.3973 CHA-F Fault-tolerance and reliability techniques for high-density random-access memories	621.398 PER-N Next generation wireless LANs :	621.398 PER-N Next generation wireless LANs :	621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters	621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters	Next

Includes bibliographical references and index.

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