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Defect-oriented testing for nano-metric CMOS VLSI circuits

By: Sachdev, Manoj.
Contributor(s): Defect oriented testing for CMOS analog and digital circuits | Pineda de Gyvez, Jose.
Material type: materialTypeLabelBookSeries: Frontiers in electronic testing: 34.Publisher: Dordrecht : Springer, c2007Edition: 2nd ed.Description: xxi, 328 p. : ill. ; 24 cm.ISBN: 9788184894295.Subject(s): Metal oxide semiconductors, Complementary -- Testing | Metal oxide semiconductors, Complementary -- Defects | Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- Defects
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Electronics and Communication Engineering 621.395 SAC-D (Browse shelf) Available 002602
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New edition of: Defect oriented testing for CMOS analog and digital circuits, 1998.

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