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Design for manufacturability and yield for nano-scale CMOS

By: Chiang, Charles 1958-.
Contributor(s): Kawa, Jamil.
Material type: materialTypeLabelBookSeries: Series on integrated circuits and systems: Publisher: New Delhi : Springer, c2007Description: xxvii, 254 p. : ill. ; 24 cm.ISBN: 9788184892424.Subject(s): Electronic circuits -- Mathematical models | Electronic circuit design
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Electronics and Communication Engineering 620.004 CHI-D (Browse shelf) Checked out 20/04/2020 002406
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620.004 BAL-R Reliability engineering 620.004 BIL-R Reliability evaluation of engineering systems : 620.004 BIR-R Reliability engineering : 620.004 CHI-D Design for manufacturability and yield for nano-scale CMOS 620.004 SLA-M Microprocessor-based design : 620.0042 HAI-E Engineering design process 620.0092 JAM-R Remarkable engineers :

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