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VLSI test principles and architectures : design for testability

By: Wang, Laung-Terng (ed.).
Contributor(s): Wu, Cheng-Wen (ed.) | Wen, Xiaoqing (ed.).
Material type: materialTypeLabelBookSeries: The Morgan Kaufmann series in systems on silicon. Publisher: New Delhi : Elsevier, ©2006Description: xxx, 777 p. : ill. ; 25 cm.ISBN: 9789380501550.Subject(s): Integrated circuits -- Very large scale integration -- Testing | Integrated circuits -- Very large scale integration -- DesignOnline resources: Table of contents | Publisher description
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Electronics and Communication Engineering REF 621.395 WAN-V (Browse shelf) Not For Loan 008153
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Electronics and Communication Engineering 621.395 WAN-V (Browse shelf) Available 002299
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621.395 WAK-D Digital design : 621.395 WAK-D Digital design : 621.395 WAK-D Digital design : 621.395 WAN-V VLSI test principles and architectures : 621.395 WES-C CMOS VLSI design : 621.395 WES-C CMOS VLSI design : 621.395 WES-C CMOS VLSI design :

Includes bibliographical references and index.

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