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Essentials of electronic testing for digital, memory and mixed signal VLSI circuits

By: Bushnell, Michael L.
Contributor(s): Agrawal, Vishwani D.
Material type: materialTypeLabelBookPublisher: New York: Kluwer Academic Publishers, 2000Description: 690.ISBN: 9780792379911.Subject(s): Digital integrated circuits--Testing
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Electronics and Communication Engineering 621.395 BUS-E (Browse shelf) Checked out 01/04/2020 001143
Books Books IIITD
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Electronics and Communication Engineering REF 621.395 BUS-E (Browse shelf) Not For Loan 001144
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621.395 BRO-F Field-programmable gate arrays 621.395 BRO-F Fundamentals of digital logic with VHDL design 621.395 BRO-F Fundamentals of digital logic with verilog design 621.395 BUS-E Essentials of electronic testing for digital, memory and mixed signal VLSI circuits 621.395 CAM-V VLSI-design of non-volatile memories 621.395 CAR-O Op amps for everyone 621.395 CHI-V VLSI CAD

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