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Fault-tolerance and reliability techniques for high-density random-access memories

By: Chakraborty, Kanad.
Contributor(s): Mazumder, Pinaki.
Material type: materialTypeLabelBookPublisher: Delhi : Pearson Education, ©2002Description: xix, 426 p.; 25 cm.ISBN: 9788178087696.
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Electronics and Communication Engineering 621.3973 CHA-F (Browse shelf) Available G01166
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621.397 UYE-C CMOS logic circuit design 621.397 UYE-C CMOS logic circuit design 621.397 UYE-C CMOS logic circuit design 621.3973 CHA-F Fault-tolerance and reliability techniques for high-density random-access memories 621.398 PER-N Next generation wireless LANs : 621.398 PER-N Next generation wireless LANs : 621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters

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