System Analysis and Modeling: Models and Reusability [electronic resource] : 8th International Conference, SAM 2014, Valencia, Spain, September 29-30, 2014. Proceedings /

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Material type: Text

TextSeries: Programming and Software Engineering ; 8769Publisher: Cham : Springer International Publishing : Imprint: Springer, 2014Edition: 1st ed. 2014Description: XXII, 314 p. 124 illus. online resourceContent type:

text

Media type:

computer

Carrier type:

online resource

ISBN:

9783319117430

Subject(s):

Additional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification:

005.1 23

LOC classification:

QA76.758

Online resources:

Click here to access online

Contents:

Reuse -- Availability, safety and optimization -- Sequences and interactions -- Testing -- Metrics, constraints and repositories.- SDL and V&V.

In: Springer Nature eBookSummary: This book constitutes the refereed papers of the proceedings of the 8th International Conference on System Analysis and Modeling, SAM 2014, held in Valencia, Spain, in September 2014. The 18 full papers and the 3 short papers presented together with 2 keynotes were carefully reviewed and selected from 71 submissions. The contributions are organized in topical sections named: reuse; availability, safety and optimization; sequences and interactions; testing; metrics, constraints and repositories; and SDL and V&V.

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Reuse -- Availability, safety and optimization -- Sequences and interactions -- Testing -- Metrics, constraints and repositories.- SDL and V&V.

This book constitutes the refereed papers of the proceedings of the 8th International Conference on System Analysis and Modeling, SAM 2014, held in Valencia, Spain, in September 2014. The 18 full papers and the 3 short papers presented together with 2 keynotes were carefully reviewed and selected from 71 submissions. The contributions are organized in topical sections named: reuse; availability, safety and optimization; sequences and interactions; testing; metrics, constraints and repositories; and SDL and V&V.

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