Advances in Pattern Recognition [electronic resource] :Joint IAPR International Workshops SSPR 2000 and SPR 2000 Alicante, Spain, August 30 – September 1, 2000 Proceedings /
Contributor(s): Ferri, Francesc J [editor.] | Iñesta, José M [editor.] | Amin, Adnan [editor.] | Pudil, Pavel [editor.] | SpringerLink (Online service).Material type: BookSeries: Lecture Notes in Computer Science: 1876Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2000.Description: XXXVI, 904 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783540445227.Subject(s): Computer science | Artificial intelligence | Computer graphics | Image processing | Pattern recognition | Application software | Computer Science | Pattern Recognition | Image Processing and Computer Vision | Computer Applications | Computer Graphics | Artificial Intelligence (incl. Robotics)Online resources: Click here to access online
Invited Papers -- Pierre Devijver Lecture -- Hybrid and Combined Methods -- Applications -- Document Image Analysis -- Grammar and Language Methods -- Structural Matching -- Graph-Based Methods -- Shape Analysis -- SSPR Poster Session -- Clustering and Density Estimation -- Object Recognition -- General Methodology I -- General Methodology II -- Feature Extraction and Selection -- SPR Poster Session.
This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.