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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

By: Pavlov, Andrei.
Contributor(s): Sachdev, Manoj.
Material type: materialTypeLabelBookSeries: Frontiers in electronic testing ; 40.Publisher: New Delhi : Springer, ©2008Description: xvi, 193 p. : ill. ; 25 cm.ISBN: 9788132202325.Subject(s): Metal oxide semiconductors, Complementary -- Design | Random access memory | Nanoelectronics
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Electronics and Communication Engineering 621.3815 PAV-C (Browse shelf) Available 009656
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Includes bibliographical references and index.

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