FEEDBACK Smiley face
Normal view MARC view ISBD view

CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test

By: Pavlov, Andrei.
Contributor(s): Sachdev, Manoj.
Material type: materialTypeLabelBookSeries: Frontiers in electronic testing ; 40.Publisher: New Delhi : Springer, ©2008Description: xvi, 193 p. : ill. ; 25 cm.ISBN: 9788132202325.Subject(s): Metal oxide semiconductors, Complementary -- Design | Random access memory | Nanoelectronics
Tags from this library: No tags from this library for this title. Add tag(s)
Log in to add tags.
    average rating: 0.0 (0 votes)
Item type Current location Collection Call number Status Date due Barcode Item holds
Books Books IIITD
General Stacks
Electronics and Communication Engineering 621.3815 PAV-C (Browse shelf) Available 009656
Total holds: 0

Includes bibliographical references and index.

There are no comments for this item.

Log in to your account to post a comment.

© IIIT-Delhi, 2013 | Phone: +91-11-26907510| FAX +91-11-26907405 | E-mail: