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Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies
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TextPublication details: Springer, ©2010 New York :Description: xv, 171 p. : ills. ; 23cmISBN: - 9781489983145
- 621.397 BOS-A
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
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IIITD Reference | Electronics and Communication Engineering | REF 621.397 BOS-A (Browse shelf(Opens below)) | Not for loan | 009733 |
Total holds: 0
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| REF 621.395 WES-C CMOS VLSI design : | REF 621.395 WES-C CMOS VLSI design : | REF 621.397 ABU-N Nanometer variation-tolerant SRAM : | REF 621.397 BOS-A Advanced test methods for SRAMs : | REF 621.397 LEE-D Design of CMOS radio-frequency integrated circuits | REF 621.397 UYE-C CMOS logic circuit design | REF 621.398 PLA-C CMOS integrated analog-to-digital and digital-to-analog converters |
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