Thoughtful machine learning: a test-driven approach
Material type: TextPublication details: New Delhi: O'Reilly, ©2015.Description: xiv, 217 p.; 22 cmISBN:- 9789351108573
- 006.31 KIR-T
Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|---|
Books | IIITD General Stacks | Computer Science and Engineering | 006.31 KIR-T (Browse shelf(Opens below)) | Available | 004777 | ||
Books | IIITD Reference | Computer Science and Engineering | REF 006.31 KIR-T (Browse shelf(Opens below)) | Available | 004778 |
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REF 006.31 GOO-D Deep learning | REF 006.31 HAS-E Elements of statistical learning : data mining, inference, and prediction | REF 006.31 HOP-L Learning tensorflow : a guide to building deep learning systems | REF 006.31 KIR-T Thoughtful machine learning: a test-driven approach | REF 006.31 MIT-M Machine learning | REF 006.31 MOH-F Foundations of machine learning | REF 006.31 MUR-M Machine learning : a probabilistic perspective |
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