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Thoughtful machine learning: a test-driven approach

By: Kirk, Matthew.
Material type: materialTypeLabelBookPublisher: New Delhi: O'Reilly, ©2015Description: xiv, 217 p.; 22 cm.ISBN: 9789351108573.Subject(s): Machine learning | Computer software--Development | Computer software--TestingOnline resources: Click here to access online
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Computer Science and Engineering 006.31 KIR-T (Browse shelf) Available 004777
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Computer Science and Engineering REF 006.31 KIR-T (Browse shelf) Not For Loan 004778
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REF 006.31 GOO-D Deep learning REF 006.31 HAS-E Elements of statistical learning : REF 006.31 HOP-L Learning tensorflow : REF 006.31 KIR-T Thoughtful machine learning: REF 006.31 MIT-M Machine learning REF 006.31 MOH-F Foundations of machine learning REF 006.31 MUR-M Machine learning :

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