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Course reserves for Memory Design and Testing

  1. Term: Winter
  2. Department: Electronics & Communication Engineering
  3. Course number: ECE611
  4. Section: UG/PG
  5. Instructors:
    • Dr. Anuj Grover
Title Item type Location Collection Call number Copy number Status Date due Notes
CMOS SRAM circuit design and parametric test in nano-scaled technologies : Reference IIITD
General Stacks
Electronics and Communication Engineering 621.3815 PAV-C Available
Nanometer variation-tolerant SRAM : Reference IIITD
Reference
Electronics and Communication Engineering REF 621.397 ABU-N Available
Low power and reliable SRAM memory cell and array design Reference IIITD
Reference
Electronics and Communication Engineering REF 621.395 ISH-L Available
Advanced test methods for SRAMs : Reference IIITD
Reference
Electronics and Communication Engineering REF 621.397 BOS-A Available
Embedded memories for nano-scale VLSIs Reference IIITD
General Stacks
Electronics and Communication Engineering REF 621.395 ZHA-E Available
Ultra-low voltage nano-scale memories Reference IIITD
General Stacks
Electronics and Communication Engineering 621.3815 ITO-U Available

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