Machine learning for high-risk applications : (Record no. 172550)

MARC details
000 -LEADER
fixed length control field 02489nam a22003257a 4500
001 - CONTROL NUMBER
control field 23340084
003 - CONTROL NUMBER IDENTIFIER
control field IIITD
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240503162051.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240426b |||||||| |||| 00| 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789355429728
040 ## - CATALOGING SOURCE
Original cataloging agency IIITD
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 006.31
Item number HAL-M
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Hall, Patrick
245 10 - TITLE STATEMENT
Title Machine learning for high-risk applications :
Remainder of title approaches to responsible AI
Statement of responsibility, etc by Patrick Hall, James Curtis and Parul Pandey
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication, distribution, etc Beijng :
Name of publisher, distributor, etc O'Reilly,
Date of publication, distribution, etc ©2023
300 ## - PHYSICAL DESCRIPTION
Extent xxi, 438 p. :
Other physical details ill. ;
Dimensions 24 cm.
501 ## - WITH NOTE
With note Includes bibliographical references and index.
505 0# - FORMATTED CONTENTS NOTE
Title Part 1. Theories and practical applications of AI risk management. Contemporary machine learning risk management -- Interpretable and explainable machine learning -- Debugging machine learning systems for safety and performance -- Managing bias in machine learning -- Security for machine learning --
-- Part 2. Putting AI risk management into action. Explainable boosting machines and explaining XGBoost -- Explaining a PyTorch image classifier -- Selecting and debugging XGBoost models -- Debuggins a PyTorch image classifier -- Testing and remediating bias with XGBoost -- Red-teaming XGBoost --
-- Part 3. Conclusion. How to succeed in high-risk machine learning.
520 ## - SUMMARY, ETC.
Summary, etc The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before we can realize AI/ML's true benefit, practitioners must understand how to mitigate its risks. This book describes approaches to responsible AI--a holistic framework for improving AI/ML technology, business processes, and cultural competencies that builds on best practices in risk management, cybersecurity, data privacy, and applied social science. Authors Patrick Hall, James Curtis, and Parul Pandey created this guide for data scientists who want to improve real-world AI/ML system outcomes for organizations, consumers, and the public.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Machine learning.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Risk management.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Artificial intelligence.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Machine learning.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Risk management.
650 #7 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name as entry element Artificial intelligence.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Curtis, James
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Pandey, Parul,
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Dewey Decimal Classification
Koha item type Books
Holdings
Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection code Home library Current library Shelving location Date acquired Bill No. Bill Date Cost, normal purchase price PO No. PO Date Total Checkouts Full call number Barcode Date last seen Cost, replacement price Price effective from Vendor/Supplier Koha item type
    Dewey Decimal Classification     Computer Science and Engineering IIITD IIITD General Stacks 25/04/2024 TB200 2024-03-30 1320.2 IIITD/LIC/BS/2021/03/69 2024-03-27   006.31 HAL-M 012940 25/04/2024 1800 25/04/2024 Technical Bureau India Pvt. Ltd. Books
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