CMOS SRAM circuit design and parametric test in nano-scaled technologies :
Pavlov, Andrei, Ph. D.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test Andrei Pavlov, Manoj Sachdev. - New Delhi : Springer, c2008. - xvi, 193 p. : ill. ; 25 cm. - Frontiers in electronic testing ; 40 .
Includes bibliographical references and index.
9788132202325
2008924192
GBA848683 bnb
014567544 Uk
Metal oxide semiconductors, Complementary--Design.
Random access memory.
Nanoelectronics.
TK7871.99.M44 / P38 2008
621.381 / PAV-C
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test Andrei Pavlov, Manoj Sachdev. - New Delhi : Springer, c2008. - xvi, 193 p. : ill. ; 25 cm. - Frontiers in electronic testing ; 40 .
Includes bibliographical references and index.
9788132202325
2008924192
GBA848683 bnb
014567544 Uk
Metal oxide semiconductors, Complementary--Design.
Random access memory.
Nanoelectronics.
TK7871.99.M44 / P38 2008
621.381 / PAV-C