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Pavlov, Andrei, Ph. D.

CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test Andrei Pavlov, Manoj Sachdev. - New Delhi : Springer, c2008. - xvi, 193 p. : ill. ; 25 cm. - Frontiers in electronic testing ; 40 .

Includes bibliographical references and index.

9788132202325

2008924192

GBA848683 bnb

014567544 Uk


Metal oxide semiconductors, Complementary--Design.
Random access memory.
Nanoelectronics.

TK7871.99.M44 / P38 2008

621.381 / PAV-C

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