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Analog IC reliability in nanometer CMOS

Maricau, Elie

Analog IC reliability in nanometer CMOS Elie Maricau & Georges gielen - New York : Springer, ©2013. - xvi,198 p.; 22 cm.

ISBN: 9781461461623

LCCN: 2012954854

Subjects--Personal Names:
Analog circuits
Linear integrated circuits--Reliability
Systems engineering

Subjects--Corporate Names:
Metal oxide semiconductors, Complementary

Dewey Class. No.: 621.381 / MAR-A

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